Vector Network Analyzer

NIST is seeking sources for a Vector Network Analyzer (VNA) to support the 'RF Waveform and Rapid Frequency-Comb Diagnostics for Plasma Etching' project under the CHIPS metrology program. The VNA will characterize RF measurement systems including waveguides and couplers for high-power waveform metrology in semiconductor plasma processing, requiring features like direct receiver access, high dynamic range, low noise floor, frequency-offset measurements, and Large Signal Network Analysis (LSNA) capabilities for harmonics and intermodulation products. This is a Sources Sought notice only.