Sources Sought Notice for CHIPS R&D Data Acquisition System

NIST is conducting market research for a Data Acquisition (DAQ) system to measure resistance and temperature changes in advanced semiconductor packaging during accelerated aging experiments as part of the CHIPS Metrology R&D program. The system must support 300-400 channels for low current/voltage 2-wire and 4-wire measurements, with a minimum scan rate of 100 channels/second, data logging software compatible with Windows 10/11, and operation in variable environmental conditions. Responses from capable manufacturers are requested to inform potential future procurement.